Advanced XAFS spectroscopy investigation of electronic and atomic structure of energy materials

CHIH WEN PAO^1*

¹X-ray Absorption Group, National Synchrotron Radiation Research Center, Hsinchu, Taiwan

* Presenter:CHIH WEN PAO, email:pao.cw@nsrrc.org.tw

Advances in energy technologies are fundamentally driven by a deep understanding of atomic- and nanoscale structural features, which increasingly depend on advanced characterization tools to observe physical and chemical processes at material interfaces. X-ray absorption fine structure (XAFS) spectroscopy, with its fingerprint-like sensitivity to local structural characteristics, offers powerful capabilities for characterizing the functionality, structural complexity, chemical environments, and interactions in energy materials used for conversion, storage, and catalysis.

The integration of in-situ measurement techniques further enables the direct observation of chemical reaction mechanisms during device operation. This presentation will highlight how XAFS spectroscopy can be employed to reveal the true electrochemical mechanisms at work during device operation. Experimental results will demonstrate how these techniques capture real-time phase transformations, chemical state changes, and interfacial dynamics in solid/gas and solid/liquid systems, providing critical insights into reaction mechanisms and advancing our understanding of functional materials.

Keywords: Synchrotron Radiation, XAFS, Energy materials